Insights
Technical insights on semiconductor test interfaces
Field notes from the mechanical side of test — contact force, burn-in, sockets, and interface design. Written by the engineer, for engineers.
- V4 · Article
Non-electrical yield loss: how contact-force damage hides in your electrical fail bins
How contact-force damage masquerades as electrical yield loss — and the mechanical root causes independent test interface engineering traces it back to.
Read → - V1 · Article
Burn-in contacting that holds: why force curves belong in the cam geometry, not the operator's wrist
Why reliable burn-in contacting engineers the force curve into the cam geometry — a companion to the patented self-locking mechanism on our Patents page.
Read → - V6 · Article
Custom vs. catalog test sockets: a decision framework for test engineers
A practical decision framework for choosing between custom and catalog test sockets — package fit, contact force, temperature, lead time, and second-source freedom.
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